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June 26, 2008
JDSU Intros Optical Test Platform
JDSU's Multiple Application Platform (MAP) optical test and measurement platform, the MAP-200, is designed for the cost-effective development and manufacturing of optical transmission network elements. It offers a portfolio of fiber optic power measurement and signal management tools. Key features include compliance with LAN eXtensions for Instruments (LXI) standards, user-friendly controls and an intuitive, multi-language GUI. It also has Interchangeable Virtual Instrument (IVI) drivers optimized for ease-of-use with most popular application development environments and provide reusable driver architecture. The drivers provide full control of MAP-200 modules and are based on common architecture to reduce the engineering time needed when working with multiple vendors. (Expo booth 543)
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